describe how we use V protocol aware solution to test a complex RF device. form reconstruction utilizes the coherency of V SOC system to. Download scientific diagram | Agilent SOC Series tester. from publication: Test engineering education in Europe: the EuNICE-Test project | The paper. Download scientific diagram | Agilent SOC Series Digital IC Test System from publication: Process Models for the Reconstruction of Software Architecture .
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Unified memory approach The entire amount of purchased memory is available for both test vectors and sequencer instructions for maximum flexibility.
As test needs change to accommodate a new class of device or next-generation performance, the Pin Scale can be instantly reconfigured through software to maximize the lifetime of your investment. Provides performance headroom for the future, protecting your investment. The Pin Scale features a Test Processor-Per-Pin architecture, which allows all processing to occur locally in the card, and in parallel across pins, providing maximum parallel efficiency.
Business Finance Agilent Pin Scale advertisement. Agilent InstaPin also maximizes asset utilization because the per-pin licenses for speed and memory depth of Pin Scale digital cards can float between pins on a card, cards in a tester and testers on a test floor or different production facilities around the world. Documents Flashcards Grammar checker.
Per-pin scalability from to Mbps The test system can be configured to match device requirements, pin-by-pin, for lowest cost. And agilennt must all be done at a lower costof-test than last year because of ongoing price erosion.
Product Summary Per-pin scalability up to Mbps High density digital card with per-pin scalability up to Mbps offers the lowest cost SOC test in production.
Per-pin software licenses for speed and memory depth mean you add just the performance you need, when you need it. Testing in higher x-modes means that more logical vector 90300 is available. Performance for next-generation SOC devices With digital speeds up to Mbps and memory up to MB X4 Mode on each pin, the Pin Scale delivers the performance demanded by next-generation devices.
Also beneficial to generate low jitter high-speed clock signals. Each pin of the Pin Scale can be scaled over its wide memory depth and speed range through per-pin software licenses, which provides the lowest cost of test by allowing the test system to be configured to match 993000 requirements, pin-by-pin.
Each pin operates independently, enabling parallel 993000 for maximum multi-site efficiency. Unified memory approach The unified memory approach pools memory for both sequence instructions and vectors. In addition, each digital pin operates in parallel, maximizing multi-site efficiency.
This enables the Agileent to offer the following pin counts: The entire amount of purchased memory is available for both test vectors and sequencer instructions, which provides more flexibility than architectures based upon two unshared memory areas. Up gailent pins Support of multi-site for high pin count devices reduces cost-of-test.
An uncertain future demands the ability to upgrade quickly to meet the next performance challenge while continuing to reduce cost-of-test. The Pin Scale protects your investment through expanded scalability, which provides the performance needed to test a wide variety of devices now and into the future. This unprecedented flexibility allows the Agilent to match the next device to be tested, instantly.
Because the reconfiguration is accomplished via software, no hardware is moved, which eliminates the need to recalibrate and eliminates the risk of hardware damage during movement. For printed directions on Preparing for Registration. With per-pin agilnet to enable the different speed and memory performance levels — part of the industry-first Agilent InstaPin performance library — the Agilemt Scale digital card can be configured to match the device requirements, pin-by-pin, resulting in the lowest cost of test.
With 32 pins on the Pin Scale digital card, an Qgilent can be configured with up to pins, providing the pin count needed for multi-site test of even high pin count devices. The value of parallel test, however, depends on its efficiency. Available per-pin licenses for memory depth: Flexible waveform generation for high-speed applications.
To test these devices, a test system must have the capability to address a range of performance challenges: This flexibility can be especially important for embedded memory, microprocessor and protocol-based communications applications.
Per-pin speed scalability from Mbps to Mbps provides the performance needed to test a wide range of interfaces, including USB2. Compatible with Agilent Ce-channels Protects your investment in equipment, people and training Additional Detail Up to pins The Pin Scale offers 32 pins per card, which is twice the density of the Ce- and P-model digital cards.
This results in minimal measurement overhead and higher throughput. Provides performance for high speed interface test, such as DDR, operating over Mbps. This unmatched performance also enables testing of logic cores in a range of applications while maintaining headroom for increasing processing speeds. Optional waveforms Provides greater timing flexibility for ease of programming.
Test Processor-Per-Pin architecture Localizing all test processing instead of using centralized resources results in minimal measurement overhead and higher throughput.
Agilent Pin Scale Product Overview Industry Challenges Consumer demand for more capability and connectivity in a single product is driving the need for more functionality, faster processing and higher speed interfaces in next-generation System-on-a-Chip SOC and System-in-Package SIP devices.
Reconfiguration is done instantly when the test program is loaded, ensuring no downtime. The Pin Scale offers broad scalability starting at Mbps for low cost, low performance needs and scaling to Mbps for higher performance demands — all with a single digital card.
This lowers immediate capital investment and provides for future growth as devices evolve from generation to generation, integrating more high-speed interfaces or achieving higher processing speeds.